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A new facility for High energy PIXE at the ARRONAX Facility
new facility High energy PIXE the ARRONAX Facility
2010/12/29
Proton Induced X-ray Emission (PIXE) using high energy protons is a non destructive multi elemental technique that can analyze medium and heavy trace elements on thick samples. A new experimental setu...
Particle induced X-ray emission (PIXE) is a physical effect that is not yet adequately modelled in Geant4. The current status as in Geant4 9.2 release is reviewed and new developments are described. T...
无标样厚靶PIXE分析中数值方法的应用
无标样 厚靶PIXE分析 数值方法
2009/7/27
本文用数值方法对厚靶PIXE分析中所测得的特征K-X射线强度进行修正.修正包括入射质子在靶中的慢化,特征X射线在厚样中的吸收以及基体元素的特征X射线引发的待测元素X射线的增强等.同时,为了进行元标样分析,同蒙特卡罗方法对整个分析系统作了效率刻度.在此基础上,对一些自制的标准厚样进行了PIXE实验分析,分析结果与已知值有较好的符合.
Aerosol composition and source apportionment in the Mexico City Metropolitan Area with PIXE/PESA/STIM and multivariate analysis
source apportionment Mexico City Metropolitan Area PIXE/PESA/STIM multivariate analysis
2009/1/15
Aerosols play an important role in the atmosphere but are poorly characterized, particularly in urban areas like the Mexico City Metropolitan Area (MCMA). The chemical composition of urban particles m...
Multielemental Analysis of Genetically Modified Food using ANAA and PIXE Techniques
Genetically Modified Food ANAA and PIXE Techniques
2010/10/15
This paper describes the application of two techniques, ANAA and PIXE, used in the analyses of some available commercial food containing regular and genetically modified ingredients, as well as soyben...
Trace Element Concentration in São Francisco River Water Using STXRF and PIXE Techniques
Trace Element Concentration Sã o Francisco River Water STXRF and PIXE Techniques
2010/10/15
Trace element concentrations in water from S˜ao Francisco River using Particle Induced X-ray Emission (PIXE) and Synchroton Total Reflection X-ray Fluorescence (STXRF) techniques are measured. Th...
PIXE, Particel Induced X-Ray Emission A Concise Review
particle induced X-ray emission elemental analysis trace element ion induced X-ray
2010/6/30
PIXE-Particle Induced X-Ray Emission is a multielemental, sensitive and non-estructive method which has been in use in trace elemental analysis since 1970. This review aims to explain the main feature...