搜索结果: 1-7 共查到“光信息技术 metrology”相关记录7条 . 查询时间(0.125 秒)
2018年SPIE光学制造，测试和计量会议（SPIE Optical Fabrication,Testing,and Metrology VI）
2018年 SPIE 光学制造，测试和计量 会议
2017/10/27
Today’s optical fabrication technologies are facing ever-increasing demands from industry and research. This is driven by tough requirements for cost and time reduction in production and R&D as well a...
2018年SPIE微光刻的计量，检验和过程控制会议（SPIE Metrology,Inspection,and Process Control for Microlithography XXXII）
2018年 SPIE 微光刻的计量，检验和过程控制 会议
2017/10/27
2018年SPIE微光刻的计量，检验和过程控制会议（SPIE Metrology,Inspection,and Process Control for Microlithography XXXII）。
2018年SPIE三维光学计量检验实际应用会议（SPIE Dimensional Optical Metrology and Inspection for Practical Applications VII）
2018年 SPIE 三维光学计量检验实际应用 会议
2017/10/27
This conference will focus on methods, analysis, and applications of optical metrology and inspection as applied to various industries, with particular emphasis on practical applications for non-optic...
2017SPIEX射线和EUV光学计量学进展专题会议（Advances in Metrology for X-Ray and EUV Optics VII）
2017 SPIEX 射线和EUV光学计量学进展 专题会议
2017/4/25
2017SPIEX射线和EUV光学计量学进展专题会议（Advances in Metrology for X-Ray and EUV Optics VII）。
2017SPIE光学计量建模会议（2017 Conference on Modeling Aspects in Optical Metrology）
2017 SPIE 光学计量建模 会议
2017/4/25
2017SPIE光学计量建模会议（2017 Conference on Modeling Aspects in Optical Metrology）。
Take this opportunity to share your research at SPIE Optical Metrology 2017. Come to Munich to meet with users and researchers to discuss the latest inventions and applications in the field of optical...
Ultra-broadband optical chirp linearization for precision length metrology applications
Laser stabilization Metrology Range finding Lidar
2015/6/8
We demonstrate precise linearization of ultra-broadband (>5 THz) laser frequency sweeps using a fiber-based self-heterodyne technique. Frequency errors less than 170 kHz relative to linearity were obs...