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A New Parameter-Extraction Method for DGS and its Application to the Low-Pass Filter
Parameter-Extraction Method DGS the Low-Pass Filter
2010/12/7
A new and simple parameter-extraction method for the equivalent circuit of defected ground structure (DGS) is presented. Using this method, circuit simulation, based on the DGS equivalent-circuit mode...
Junction Parameter Extraction for Electronic Device Characterization
Junction Parameter Extraction Electronic Device Characterization
2010/12/7
A new method for the extraction of junction parameters from a description of the current–voltage characteristic is developed. A simulation is performed and a high accuracy is obtained for the determin...
VDMOSFET Model Parameter Extraction Based on Electrical and Optical Measurements
VDMOSFET Parameter extraction Lateral parameters Hexagonal cell
2010/12/8
Lateral Device parameters for VDMOSFET (Vertical double diffused metal oxide semiconductor field effect transistor) with hexagonal cells has been extracted by an original model based on electrical and...