搜索结果: 1-1 共查到“noncontact atomic force microscopy”相关记录1条 . 查询时间(0.046 秒)
Potential contributions of noncontact atomic force microscopy for the future Casimir force measurements
Potential contributions noncontact atomic force microscopy the future Casimir force measurements
2010/11/5
Surface electric noise, i.e., the non-uniform distribution of charges and potentials on a surface, poses a great experimental challenge in modern precision force measurements. Such a challenge is enc...