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第20届非接触原子力显微镜国际会议（20th International Conference on Non-Contact Atomic Force Microscopy）
第20届 非接触原子力 显微镜 国际会议
2017/7/6
NC-AFM 2017 is the 20th international conference on Non-Contact Atomic Force Microscopy (NC-AFM), which is one of the most influential conference series in the field of scanning probe microscopy.
An in-plane gate transistor fabricated by using the atomic force microscopy (AFM) lithography is investigated in this paper. By performing repeated oxidation and de-oxidation procedures by using AFM f...
Water distribution at solid/liquid interfaces visualized by frequency modulation atomic force microscopy
Water distribution solid/liquid interfaces visualized frequency modulation atomic force microscopy
2010/10/12
Interfacial phenomena at solid/water interfaces play an important role in a wide range of industrial technologies and biological processes. However, it has been a great challenge to directly probe the...
Investigation of the topography of magnetron-deposited Cu/Ni multilayers by X-ray reflectometry and atomic force microscopy
multilayers Cu/Ni X-ray reflectometry (XRR)
2011/5/11
This paper presents the results of research of Cu/Ni multilayers magnetron-deposited on an Si (100) substrate. The thickness of Cu sublayers was identical in all multilayers and equalled 2 nm. The th...
Charge Characterization Of An Electrically Charged Fiber Via Electrostatic Force Microscopy
Electrically Charged Fibe Via Electrostatic
2009/3/2
The charge of a corona charged electret fiber as well as an uncharged glass fiber was characterized via Electrostatic Force Microscopy (EFM). Electrostatic force gradient images were obtained by monit...
Application of dynamic impedance spectroscopy to atomic force microscopy
atomic force microscopy dynamic electrochemical impedance spectroscopy non-stationarity
2010/10/12
Atomic force microscopy (AFM) is a universal imaging technique, while impedance spectroscopy is a fundamental method of determining the electrical properties of materials.It is useful to combine those...
We consider the problem of uncertainty in geometrically linear measurements in scanning probe microscopy (SPM) represented by atomic force microscopy (AFM). The uncertainties under consideration are a...