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2018年SPIE光学制造，测试和计量会议（SPIE Optical Fabrication,Testing,and Metrology VI）
2018年 SPIE 光学制造，测试和计量 会议
2017/10/27
Today’s optical fabrication technologies are facing ever-increasing demands from industry and research. This is driven by tough requirements for cost and time reduction in production and R&D as well a...
Time-Resolved Error Vector Magnitude for Transmitter Mask Testing in Coherent Optical Transmission Systems
Time-Resolved Optical Transmission Systems Mask Testing
2015/5/15
We propose a novel transition-sensitive measurement approach for coherent optical systems. The time-resolved error vector magnitude (EVM), combined with mask testing, is a powerful tool for pass/fail ...