搜索结果: 1-2 共查到“电子科学与技术 scanning probe”相关记录2条 . 查询时间(0.104 秒)
Since the invention in 1980s, scanning probe microscopy (SPM) has been considered as the valuable avenue to visualize topography of sample in nanoscale. After more than 30-year development, SPMs have ...
Scanning probe makes 'nano Matterhorn'(图)
scanning probe a nanometre-sized tip smaller circuits
2010/4/28
IBM researchers have used a nanometre-sized tip to create features as small as 15 nm in organic resist materials, which are normally used to make semiconductor chips. This is half the size of structur...