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Investigation on microstructure evolution of oxidized Ni/Au ohmic contacts to p-GaN by XRD
microstructure evolution Ni/Au p-GaN XRD
2010/7/15
The microstructure evolution of oxidized Ni (20nm)/Au (20nm) contact to p-GaN with increasing annealing temperature was studied by synchrotron x-ray diffraction (XRD) and powder XRD. With the increase...
Evolution of the Microstructure and Performance of Pd/Ag - Based Thick Conductors
the Microstructure and Performance of Pd/Ag Thick Conductors
2010/12/23
Pd/Ag-based inks are probably the most commonly used conductors in thick-film hybrid technology. The evolution of the microstructure of these films was studied on samples fired with isochronal cycles ...